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Elemental content analysis of Copper concentrates

2022-07-03 16:02:10   

Application Overview 

   Concentrates are intermediates for further smelting metal products obtained after beneficiation. In addition to the determination of quality elements, concentrate samples also need to measure high-value elements such as gold, silver, platinum, and palladium, as well as harmful elements such as cadmium, mercury, lead, arsenic, and fluorine.The accuracy of X-ray fluorescence spectroscopy is challenged due to the complex mineral and element composition, the wide range of element content, and the low content of impurities and harmful elements in concentrate samples.The single-wavelength excitation-energy dispersive X-ray fluorescence spectrometer combined with the fast basic parameter method can greatly improve the precision of elemental analysis of concentrate samples, while having the characteristics of wide elemental analysis range and fast analysis speed.

  High-value elements such as platinum and palladium, as well as harmful elements such as cadmium, mercury, lead, arsenic, and fluorine. Due to the complex mineral composition and element composition of concentrate samples, wide range of element content, and low content of impurities and harmful elements, it brings challenges to the analysis accuracy of X-ray fluorescence spectrometry. The monochromatic excitation energy discrete X-ray fluorescence  Spectrometer combined with fast Fundamental parameter method greatly improves the elemental analysis accuracy of concentrate samples, and represents characteristics of wide elemental analysis range and fast analysis speed.
















Performance datas
(1)Range of Elements

Main Elements	Cu、Fe、S
Impurity Elements	MgO、CaO、Al2O3、SiO2
Trace Elements	Cl、Mn、Cr、Bi、As、Zn、Sb、Pb、Ni、Cd、Ag

 

(2)Linearity
Table 1  Linearity summary table of element calibration curve

Elements	Range	Linearity(R2）
Fe	17.78~32.9	0.991
MgO	0.14~6.69	0.993
CaO	0.45~5.09	0.999
Al2O3	0.16~4.16	0.990
SiO2	1.04~17.27	0.990
Cl	0.1~0.46	0.997
Cr	0.02~0.54	0.993
Bi	0.0001~0.41	0.981
As	0.004~0.81	0.994
Zn	0.041~8.04	0.998
Sb	0.0001~0.18	0.988
Pb	0.01~2.61	0.997
Ni	0.011~0.36	0.992

 

 
(3)Precision

Measure Times	As(%)	Pb(%)	S(%)	Cu(%)	CaO(%)	Cr(%)	Fe(%)	Zn(%)	Ag(%)	Bi（%）	Sb(%)
1	0.0063	0.0166	23.97	21.84	3.629	0.0711	28.00	0.251	0.0062	0.0031	0.0134
2	0.0058	0.0169	23.65	21.91	3.605	0.0681	28.10	0.250	0.0068	0.0029	0.0129
3	0.0065	0.0160	23.25	21.80	3.586	0.0739	28.01	0.248	0.0062	0.0024	0.0133
4	0.0057	0.0172	24.01	21.88	3.640	0.0739	28.14	0.249	0.0065	0.0029	0.013
5	0.0061	0.0167	23.83	21.84	3.645	0.0703	28.09	0.249	0.0064	0.0025	0.013
6	0.0067	0.0162	23.91	21.89	3.642	0.0732	28.14	0.248	0.0070	0.003	0.013
7	0.0060	0.0165	23.64	21.86	3.655	0.0739	28.09	0.251	0.0064	0.0029	0.0131
Means	0.0061	0.0166	23.61	21.86	3.629	0.0721	28.08	0.249	0.0065	0.0028	0.0131
RSD（%）	5.93	2.44	0.70	0.17	0.68	3.18	0.21	0.46	4.29	9.27	1.39

 

（4）Accuracy

 

Method principle
(1)Monochromatic focusing excitation technology

      

●   It makes that element detection sensitivity has been improved by 2 orders of magnitude. 


●   Realizing the ability to analyze trace metal elements.

    Patent No：ZL 2015 1 0567341.1 
 
 




(2)Fast Fundamental Parameters（Fast FP^®）

●  Using a library of basic parameters and a series of advanced mathematical models.
 

●  Resolving uncertainties and analytical errors associated with various XRF effects.

●  Enables quantitative analysis of all types of samples without standard samples.




Features and advantages
 
   High accuracy


Cu absolute deviation <0.3%, other trace elements relative deviation <15%.
 

   Fast Speed


Analysis time within 10 minutes per sample.
 
 
   Simple to calibrate
 

A calibration curve can be created from a small amount of sample.


   Long term stability


Using detector feedback control, the hardware is stable and reliable for a long time.



Original statement:
This article is the original work of ancoren company except for the quotation. If it is forwarded and quoted, the source must be indicated, otherwise it may involve infringement. For more detailed technical information, please consult the staff of Ancoren.
 

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