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Elements quantitative by XRF with FP
2020-07-01 21:06:53   



Overviews
        For the analysis of some elements, it is extremely difficult to find the standard samples. Meanwhile, the development of the analytical methods also is difficult and time-consuming. The quantitative analysis of the elements is a challenge. The fast fundamental parameters method combining with high sensitivity XRF does not rely on the standard samples, which provides an effective method for the rapid quantitative analysis of the elements of the various unknown sample.

 About elemental analysis        
        There are many types of apparatus for the laboratory elements analysis, for example, Atomic Absorption Spectrophotometer (AA), Atomic Fluorescence Spectrophotometer (AFS), Plasma emission spectrometer (ICP), Plasma emission spectrometer-mass spectrometer (ICP MS), Elements analyzer, etc. However, firstly, these instruments need to establish the standard curves, then analyze the unknown samples. In principle, it is impossible to perform quantitative (or semi-quantitative) analysis without the standard samples.

        X-ray fluorescence spectroscopy (XRF) is one of the common methods for the elements analysis. It has the mature physical theories and a comprehensive database of the fundamental parameters ranging from the occurrence of the X-rays, the filtering treatment of the primary X-rays, the interaction between X-rays and samples (fluorescence and scattering effects) and the response mechanism of the detector for the X-rays. These explicit physics theories are modeled mathematically. The fundamental parameter method of XRF can be established to complete the rapid quantitative analysis of elements for the various unknown samples.


 
    Difficulties for the elemental analysis            Solution

    Complex sample processing
  
    Limited analysis element range         
 
    Difficulty for the light elements analysis
 
    Lack of the standard samples
 
    Long time period
 
  The HS XRF combining with fast FP maybe can solve the difficulties of some elements analysis
 



 Fast fundamental parameters method       
        The FP (fundamental parameters) method is an effective algorithm for the X-ray fluorescence spectrum. It can perform the qualitative and quantitative analysis for the elemental composition of the samples or the thickness of the coating film in the case of few or no the standard samples. As we all know, the biggest problem in X-ray fluorescence analysis is the effect of the matrix and coexisting elements (inter-element absorption enhancement effect). It is usually not linear between the fluorescence intensity of elements and the concentration of elements. It considers the effect of the matrix and the absorption enhancement effect of the coexisting elements in the spectral calculation process of the fundamental parameter method. So the linear relationship between the calculated content and the known concentration can be accurately obtained. The system error is removed by using a few known concentration sample to correct algorithms, attaining the purpose of the accurate quantification.

       The researchers in Anchoren do theirs best to develop the XRF for many years. They have successfully developed the fast fundamental parameter method (Fast FP), which has improved the accuracy of the quantitative and calculation speed to an unprecedented level. At the same time, it adapts to various types of samples. It enables rapid quantitative analysis for the unknown samples with few or no standard samples.



The software interface of Fast FP

The advantages of Fast FP:
-The superior fundamental parameters method: It considers and all of physical effects about XRF and build mathematicization model.

- Support secondary application development: various parameters such as the sample matrix, elements range, background subtraction algorithm can be defined to obtain more accurate analysis results

- Visualization: calculation spectrum and acquisition spectrum fitting in forward calculation and reverse fitting, background deduction, dynamic visualization.

- Fast: It adopts advanced software design to complete each massive operation on the ordinary computer in milliseconds.

- Accuracy: more accurate quantitative results can be obtained without the standard samples, and more accurate analysis results can be obtained after calibration of a few standard samples.



 High-sensitivity X-ray fluorescence spectrometry
(the invention patent)
Principle
     The fully focused hyperbolic curved crystal only diffracts the high-intensity characteristic rays of the target in the emission spectrum of the X-ray tube. Then, the monochromatic excitation is focused on the smaller surface of the samples, eliminating the background interference of the scattered rays in the incident spectrum, increasing the signal intensity, getting the higher ratio of the signal-to-noise.

     The high-sensitivity X-ray fluorescence spectrometry extends the range of the elements analysis from the constant to the trace analysis.



Apparatus types and function

Apparatus types types function
MERAK-LEII
The analysis of the light elements
 
The lower detection limit for the light elements range (Na-Ti)
MERAK-ULE The analysis of the ultralight elements
It not only has a very low detection limit for (Na-Ti), but also extends to the analysis of ultra-light elements (C, N, O, F)
 
PHECDA series
The analysis of the metal elements
 
Elements range (Mg-U)          
the lower detection limit for the metal elements


• Summary
       The high-sensitivity X-ray fluorescence spectrometry reduces the detection limit of the elements to sub-ppm level, which is capable of analyzing trace elements of the samples. The fast fundamental parameters method can quickly establish the quantitative applications of the elements without the standard samples, and obtain more accurate quantitative results, providing the favorable methods of the elements analysis for various field.

Apparatus types and function

1、High-sensitivity X-ray fluorescence spectrometry is the invention patent of Anchoren. We will take legal action for any infringement.
2、All articles on this website are written by Anchoren. Please do not reprint without the permission.
3、For any detailed technical questions, please contact the researchers of our company at any time.