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To reduce automotive exhaust pollution, developed countries limit sulfur in fuels to 10 mg/kg, requiring stringent control throughout production and distribution. Lower sulfur demands advanced detection methods. China's National V/VI standards adopt ASTM D7039 (Monochromatic WDXRF for gasoline/diesel sulfur).
Chlorine causes catalyst consumption and equipment corrosion, necessitating chlorine analysis for quality control.
Recent reports of silicon contamination damaging engines led China to establish silicon control standards.
Gasoline refining/distribution requires monitoring S, Cl, Si, P, Al. Conventional multi-method approaches (UVF for S, microcoulometry for Cl, ICP-OES for Si) are complex and costly.
MERAK-LEII, a next-gen MWD XRF spectrometer, delivers <1 ppm detection limits for light elements (S, Cl, Si, P, Al) in crude oil to refined fuels, enabling simultaneous analysis.
• Integrated Light Element Analysis
S LLD: 0.15 ppm, Cl LLD: 0.1 ppm, Si LLD: 0.65 ppm, P LLD: 0.5 ppm, Al LLD: 6.0 ppm. Extends to Na-Ti elements; configurable for C/N/O/F.
• Selective Excitation
High-flux doubly curved crystals monochromate/focus characteristic X-rays, exciting light elements while reducing background and enhancing peak-to-background ratios.
• Unified Light Element AnalysisQuantifies S/Si/Cl in fuels in a single run—eliminating multi-instrument workflows.
• High StabilityX-Ray Fixed System (XFS) optics prevent post-calibration drift.
• Low Maintenance & ConsumablesNo vacuum films/gas cylinders. Only sample cups/films consumed.
Detection Limits
S LLD: 0.15 ppm
Cl LLD: 0.1 ppm
Si LLD: 0.65 ppm
P LLD: 0.5 ppm
Al LLD: 6.0 ppmRange
0.5 ppm - 5%
Test Time
30-300 s (user-selectable)
Repeatability
S r ≤0.8 ppm (5.0 ppm), 2.5 ppm (50 ppm)
Cl r ≤0.2 ppm (2.0 ppm), 0.5 ppm (10 ppm)
Si r ≤2.0 ppm (10 ppm)
Al r ≤3.0 ppm (30 ppm)Methods
S: ASTM D7039, ISO 20884, NB/SH/T 0842-2017
Cl: ASTM D7536, ISO 15597, NB/SH/T 0977-2019
Si: ASTM D7757, NB/SH/T 0993-2019X-ray Tube
Cr target, 50W, micro-focus
Power
(110±10) VAC, 5A; (220±20) VAC, 5A
Software
Windows OS, LIMS-compatible
Temp. Range
10°C ~35°C
Trace silicon analysis in gasoline/diesel/naphtha/aromatics
—— High-sensitivity XRF for accurate silicon quantification
MERAK-LEII resolves ICP-OES limitations in silicon speciation.
Simultaneous S/Cl/Si/P/Al analysis in petrochemicals
—— Multi-element high-sensitivity XRF
Monochromatic excitation reduces background, enabling synchronous 4-element analysis.
Organic/inorganic chlorine analysis in crude oil—— Precision chlorine XRF
Overcomes high-sulfur interference for synchronous organic/inorganic Cl detection.
Petrochemical Elemental Analysis Solutions
Monochromatic wavelength-dispersive XRF (MWD XRF) DUBHE series achieves single-element accuracy. High-sensitivity XRF (HS XRF®) MERAK series delivers integrated analysis of S, Cl, Si, P, Al in petrochemicals/fine chemicals.
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