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Ancoren successfully developed the leading fast fundamental parameter method

2020-01-30 21:19:22   

      Fast FP improve the quantitative level and expand the application field of XRF
      After years of research and development by R & D of Ancoren ,we have successfully developed the leading fundamental parameter method (Fast FP). As we known, FP is an effective quantitative algorithm of XRF, which can effectively solve the problems of XRF in the quantitative analysis of elements, such as matrix difference, element absorption and enhancement effect, lack of standards samples and so on.
      Our Fast FP is independent intellectual property rights. It is a leader in background subtraction algorithms, software calculation speed, visualization, and quantitative precision. It also supports user application development ,and provides reliable method system support for rapid quantitative analysis of elements in various applications .

Fast FP software

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